Broad Ion Beam Milling Cross Section Polisher for SEM Sample Prep

Pristine Sample Preparation - High Speed Milling - Cryo and Air-Isolation

 

High Speed Ion Beam Milling System - Cryo and Air-Isolation Milling System

The JEOL Cross Section Polisher (CP) is a tabletop milling and polishing system that is ideally suited for preparation of a variety of environment and beam sensitive materials, including metals, polymers, ceramics, Lithium Ion Batteries, and composites. The JEOL CP is proven technology for creating artifact-free cross sections and polished surfaces for a variety of soft and hard samples, including oil shale, paper, and galvanized steel without crumbing, smearing, or distortion of the sample. The CP is the ideal solution for preparing Additive Manufacturing samples for imaging and analysis, and for chemical EDS analysis of materials.

Let us help you find the right solution for your applications for sample preparation and for Scanning Electron Microscopy.  Send us your sample for an online demonstration.  

The JEOL CP Advantage

  • Clean polished cross section of hard, soft, and composite materials
  • Clean surface with minimal strain or distortion
  • Wide area cross sections (up to several mm across)
  • Easy touch panel operation
  • Fast, clean sample preparation with 2-in-one milling and coating system
Cooling CP Advantages
  • Nitrogen cooling prevents thermal damage to materials with low melting and low glass transition points
  • Air Isolation transfer system protects samples that are sensitive to exposure

 

 

To register for a demo or to meet with a JEOL representative, please complete the form below. 

By completing and submitting this form, you agree to the JEOL USA, Inc. Privacy Policy, and that your information may be shared with JEOL USA, Inc. and other JEOL affiliates.

View the video on LiB sample preparation