Looking for a compact, versatile, easy to use Scanning Electron Microscope for your imaging and analysis applications?
Ask us about our special pricing and how you can get the latest JEOL SEM technology for your lab.
SMART - FLEXIBLE - POWERFUL
- Fully embedded EDS system with Live Analysis
- Zeromag Navigation for a seamless transition from an optical to an SEM image
- High resolution with unsurpassed low kV performance
- High vacuum to expanded pressure in low vacuum mode
- Large specimen chamber with multiple ports (IT500)
- All your needs fulfilled for SEM EDS (also known as SEM EDX)
JEOL USA, Inc. | 11 Dearborn Road | Peabody, MA 01960