In this presentation, we will discuss a new, completely redesigned high-resolution time-of-flight mass spectrometer for GC-MS analysis that combines a new TOF analyzer with integrated software that makes use of all of the available information to identify compounds in complex mixtures. Specifically, this new GC-MS system features increased resolving power (R > 30,000) and high mass accuracy (< 1 ppm) while also offering a full complement of ionization techniques. These include classical electron ionization (EI), three kinds of soft Ionization (CI, PI, FI) and combination EI/FI/FD and EI/PI ion sources. Additionally, the system is equipped with new data analysis software that uses high resolution MS in combination with EI and soft ionization methods to automatically identify analytes within complex mixtures. The software workflow consists of chromatographic peak deconvolution followed by database matching, elemental composition determination for the molecular ion, isotope pattern matching, and EI fragment accurate mass analysis to identify the most likely candidates for compounds registered in the databases. This information can also facilitate the identification of compounds that are not in the database. A variety of materials will be analyzed to show the effectiveness of combining this new-high performance GC-MS with our new automated qualitative analysis software.
Key Learning Objectives:
John graduated from Colorado School of Mines in 2006 with a doctorate in applied chemistry with a focus on mass spectrometry. Afterwards, he a took a postdoctoral position at the National Renewable Energy Laboratory to study biodiesel combustion. John joined JEOL USA, Inc. in 2008 as an MS applications chemist supporting all MS product lines, which include GC-MS, GCxGC-MS, MALDI-MS, and DART-MS. John was promoted to MS Product Manager in October 2020. He currently lives in the Boston area and enjoys getting outdoors whenever possible.