Join us for this webinar on April 29th, 2025 at 2pm EST. You won't want to miss it!
The Gather-X windowless energy-dispersive (EDS) detector is ideal for higher sensitivity analyses, higher spatial resolution mapping, and the detection of lower energy X-rays down to Li. This detector is fully integrated and embedded within the JEOL FESEM software interface, providing safe operation and high sensitivity at the short working distances required for achieving ultra-high spatial resolution. It enables higher count rates allowing for fast collection times, minimizing potential beam damage with sensitive specimens. Higher throughput is achieved with EDS analysis completed at the same conditions used for high-resolution imaging (low accelerating voltage, low probe current, and short working distance). This innovative technology enables collection of the entire range of X-rays using electron beam voltages up to 30kV, with improved detection sensitivity for characteristic X-rays less than 1 keV and the ability to detect soft X-ray regions less than 100eV. In this webinar, the benefits of this detector will be demonstrated through a variety of examples of nanostructures from several types of nanoscale devices. Examples include semiconductor devices, nanoparticles, and a lithium metal anode cross section prepared with a broad argon ion beam and using an air-isolated workflow.
Dr. Jennifer Misuraca is the FESEM Product Manager at JEOL USA. She is also responsible for customer applications support and training, technical product support, and microscope demonstrations. Dr. Misuraca obtained her PhD in Physics from Florida State University in 2012. For her research, she fabricated, measured, and analyzed lateral spin transport devices at cryogenic temperatures. In her joint postdoctoral position at Brookhaven National Lab and the University of Illinois Urbana-Champaign, she searched for novel high-Tc superconductors by flux growth of highly correlated single crystalline materials and characterization of their thermal, electrical, and magnetic properties. She has worked at JEOL USA as an Applications Specialist since 2014 and was promoted to Senior SEM Applications Specialist in 2021, and then FESEM Product Manager in 2023. She is currently a board member of the New England Society for Microscopy.
