JEOL is proud to announce our latest gas chromatograph-high resolution time-of-flight mass spectrometer, the JMS-T2000GC "AccuTOF™ GC-Alpha." This next-generation GC-MS system represents a significant improvement in both performance and functionality by using two newly developed key technologies. The AccuTOF™ GC-Alpha features greatly improved basic hardware performance and a new generation of automated data analysis software that is included in the standard configuration.
High-Performance Hardware
The JMS-T2000GC “AccuTOF™ GC-Alpha”, the 6th generation of our successful AccuTOF™ GC series, features new high-performance hardware that achieves three times the mass resolving power (R≥30,000) and mass accuracy (≤ 1ppm) over the previous “AccuTOF™ GCx-plus” by using a whole new ion optics design that achieves excellent sensitivity and high data acquisition speed, the long-time hallmarks for the AccuTOF™ GC series. This system also has a wide dynamic range that is beneficial not only for quantitative analysis but for qualitative analysis of complex mixtures.
Additionally, a wide variety of ionization techniques – field ionization (FI), photoionization (PI), and chemical ionization (CI) – are optionally available, in addition to the standard electron ionization (EI). Two combination ion sources are also available as options – the EI/FI/FD combination ion source and the EI/PI combination ion source which allow easy switching between hard and soft ionization techniques without breaking vacuum or replacing the ion sources.
Powerful, Streamlined Data Analysis
As the latest system in the AccuTOF™ GC series, the JMS-T2000GC also features new analysis software: msFineAnalysis. The msFineAnalysis software is a new generation of automated data analysis software that provides qualitative results by combining data acquired by EI and soft ionization (FI, CI, or PI) in a simple, speedy and automated way.
This software makes full use of the high-quality EI and soft ionization data obtained by the AccuTOF™ GC-Alpha, thus providing a new approach to qualitative analysis for identification of unknown compounds. Additionally, the new two-sample comparison function provides Volcano Plots, which visually illustrates the distinguishing components between the two samples. After identifying these differences, msFineAnalysis then does an integrated analysis for all sample components. The software also supports analysis of GC/EI data alone.
JEOL Solution
To learn more about the JMS-T2000 AccuTOF™ GC-Alpha, our catalogue of time-of-flight mass spectrometers, or discover how your workflow can be made easier with JEOL equipment, fill out the form and a mass spectrometry expert will be in touch within 24 hours.
The JMS-T2000GC AccuTOF™ GC-Alpha is the 6th generation JEOL GC-TOFMS and has an improved ion optics system to achieve ultra-high resolution.
The AccuTOF™ GC-Alpha is an orthogonal-acceleration time-of-flight mass spectrometer (oaTOFMS) with dual stage reflectron. It employs an ideal ion optical system realizing both high ion transmission (=sensitivity) and ultra-high resolution.
With the newly developed hardware, the AccuTOF™ GC-Alpha features 6 times higher resolution than the first generation AccuTOF™ GC and has a mass accuracy of ≤ 1 ppm.
Acquiring unrivaled high-quality data, the AccuTOF™ GC-Alpha is the ultimate solution for GC-MS qualitative analysis.
